Semiconductor
Semiconductors are materials with conductivity between conductors and insulators at room temperature. They are widely used in integrated circuits, consumer electronics, communication systems, photovoltaic power generation, and more. New-generation semiconductor materials feature stable structures and superior electrical characteristics.
Fan-out WLP Inspection
The Fan-out Wafer Level Packaging (WLP) process provides benefits including smaller and thinner packages, cost-effectiveness, superior electrical/thermal performance, and suitability for high-frequency applications. These advantages make it widely promising for use in 5G wireless communications, millimeter-wave radar technology, and optoelectronics.
3C Manufacturing
As the 3C (computers, communications, consumer electronics) manufacturing industry continues to advance, enterprises must comprehensively enhance product quality to stay competitive and ensure survival in a fierce market. Quality has become the most powerful tool for market capture. Ensuring product quality requires strict control throughout the production process. AEH offers professional inspection solutions that effectively reduce input and manufacturing costs for the electronics manufacturing industry.
Mobile Phone Glass Inspection
Glass covers for digital products are increasingly being replaced by 2.5D and 3D glass. Compared with ordinary flat glass, 2.5D glass features rounded edges, while 3D glass features curved designs for both the center and edges. 3D glass is thinner, lighter, fingerprint-resistant, anti-glare, and weather-resistant, providing a sleek look, improved user experience, and better touch sensitivity—making it a popular choice for premium smartphones and wearable devices.
Due to the complex and precise manufacturing processes, 3D glass is challenging to produce and has a low yield rate, resulting in high costs. Therefore, rapid inspection of its 3D features during quality control is essential to provide immediate feedback to production lines, preventing large-scale defects.
